ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,038, issued on July 14, was assigned to CHUBU UNIVERSITY EDUCATIONAL FOUNDATION (Aichi, Japan) and NTN Corp. (Osaka, Japan). "Vibration mea... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,039, issued on July 14, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Translational mass accelerometer" was invented by ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,040, issued on July 14, was assigned to SEIKO EPSON Corp. (Japan). "Physical quantity sensor and inertial measurement unit" was invented by... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,041, issued on July 14, was assigned to Enplas Corp. (Saitama, Japan). "Socket and inspection socket" was invented by Rui Zhi Law (Singapor... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,042, issued on July 14, was assigned to XINGR TECHNOLOGIES (ZHEJIANG) Ltd. (Yiwu City, China). "Socket assembly" was invented by Choon Leon... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,043, issued on July 14, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea). "Electrically conductive contact pin" ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,044, issued on July 14, was assigned to JF MICROTECHNOLOGY SDN. BHD. (Petaling Jaya, Malaysia). "Spring contact in a testing apparatus for ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,045, issued on July 14, was assigned to STAR TECHNOLOGIES INC. (Hsinchu City, Taiwan). "Probe card, and supporting structure and probe stru... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,046, issued on July 14, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan). "Probe passing method and probe" was invented by A... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,047, issued on July 14, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan). "Composite probe, method for attaching probe, and ... Read More